In situ transmission electron microscopy of resistive switching in thin silicon oxide layers FIB Lamella, Holography, Lightning, Materials Science, Micro Electronics Skills Posted on July 10, 2017 ← In Situ TEM Analysis of Organic–Inorganic Metal-Halide Perovskite Solar Cells under Electrical Bias Studying Dynamic Processes of Nano-sized Objects in Liquid using Scanning Transmission Electron Microscopy →