Improved FIB lamella preparation

DENSsolutions introduces the 3rd generation of the FIB stub which enables researchers to prepare a lamella and place it directly on the Nano-Chip, all inside the FIB. In this version, many improvements were made to make the FIB sample preparation easier, safer and quicker. Read the interview with Product Manager Dr. Yevheniy (Gin) Pivak who headed the development.

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Interview with Prof. Angus Kirkland, Science Director at the new Rosalind Franklin Institute, UK

We interviewed Prof. Angus Kirkland, Professor at the Department of Materials, University of Oxford and the science director at the Electron Physical Science Imaging Centre (EPSIC), Diamond Light Source UK. We talked about the new Rosalind Franklin Institute where he performs disruptive research projects in life sciences involving physical science methods, techniques, and instruments including In Situ TEM and correlative imaging.

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Interview with Prof. Rafal Dunin-Borkowski, Director of Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons in Jülich

We interviewed Prof. Rafal Dunin-Borkowski, Director of Ernst Ruska-Centre (ER-C) for Microscopy and Spectroscopy with Electrons in Forschungszentrum Jülich, Germany. We talked about his road to ER-C, his research into more energy-efficient electronic devices, the growing importance of software and data analysis and the need for automation to improve the measurement of weak signals.

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Interview with Prof. Sara Bals, head of EMAT Antwerp

We interviewed Sara Bals, head of the Electron Microscopy group at the University of Antwerp (EMAT). We talked about her passion for electron microscopy, her team and the importance of tomography when creating 3D images that reveal the real structures of nanoparticles and clusters. This technique can lead to the development of novel materials and improvements in application fields such as catalysts.

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