Sample Preparation tips
One of the most crucial applications of a focused ion beam (FIB) is preparing and transferring lamellae for transmission electron microscopy (TEM) investigations. Typically, sample preparation using a FIB is a very time-consuming and risky procedure.
This technique decreases preparation time, while diminishing the risks involved during thinning and transferring of the lamella.
Specially designed technique for graphene transfer onto our Nano-Chips.
Nanoparticles / Powders
For nanoparticle and crushed powder samples, simply pipette the solution directly onto the microheater spiral of the Nano-Chip.
Using a thin film deposition device, place your Nano-Chip in the sputtering chamber and deposit the film onto the device.
Sample Preparation Guides
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