Our In Situ Solutions
DENSsolutions introduces its new In Situ TKD Stage for heating and/or biasing inside a Scanning Electron Microscope (SEM). The TKD Stage allows you to perform high resolution microstructural characterization using Transmission Kikuchi Diffraction (TKD) while heating or biasing your sample. Learn all about its innovative design and benefits in an interview with our Product Manager, Dr. Gin Pivak.
Direct observation of chemical dynamics in Pt catalyst during CO oxidation by operando electron microscopy
Wednesday, December 16
Redox dynamics of active metal catalysts studied by Operando TEM
Tuesday, January 14
In Situ Electron Microscopy Study of High-Temperature Dynamics in Metal-Intercalated Layered Materials
Wednesday, January 27 & 28
Feel free to contact us with any further questions.
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