DENSsolutions introduces its new In Situ TKD Stage for heating and/or biasing inside a Scanning Electron Microscope (SEM). The TKD Stage allows you to perform high resolution microstructural characterization using Transmission Kikuchi Diffraction (TKD) while heating or biasing your sample. Learn all about its innovative design and benefits in an interview with our Product Manager, Dr. Gin Pivak.

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