Preparation and testing of MEMS-based samples for in situ heating and biasing in the TEM/STEM FIB Lamella, Lightning Skills Posted on December 5, 2019 ← In situ heating TEM observations of evolving nanoscale Al–Mg–Si–Cu precipitates Real-Time Electron Nanoscopy of Photovoltaic Absorber Formation from Kesterite Nanoparticles →