FIB Lamella Archives - DENSsolutions

Preparation and testing of MEMS-based samples for in situ heating and biasing in the TEM/STEM

Preparation and testing of MEMS-based samples for in situ heating and biasing in the TEM/STEM

by Olaf Weller | Dec 5, 2019

Preparation of high-quality planar FeRh thin films for in situ TEM investigations

Preparation of high-quality planar FeRh thin films for in situ TEM investigations

by Merijn Pen | Nov 6, 2017

Atomic-resolution imaging of electrically induced oxygen vacancy migration and phase transformation in SrCoO2.5-σ

Atomic-resolution imaging of electrically induced oxygen vacancy migration and phase transformation in SrCoO_2.5-σ

by Merijn Pen | Aug 1, 2017

In situ transmission electron microscopy of resistive switching in thin silicon oxide layers

In situ transmission electron microscopy of resistive switching in thin silicon oxide layers

by Merijn Pen | May 2, 2017

FIB Based Fabrication of an Operative Pt/HfO2/TiN Device for Resistive Switching inside a Transmission Electron Microscope

FIB Based Fabrication of an Operative Pt/HfO2/TiN Device for Resistive Switching inside a Transmission Electron Microscope

by Merijn Pen | May 1, 2017

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