Ion-beam deposited platinum as electrical contacting material in operando electron microscopy experiments at elevated temperatures

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June 20, 2023

← Characterization of micro-burnup treat irradiated U-22.5 at.% Zr and U-52.8 at.% Zr foils by transmission electron microscopy and X-ray diffraction Direct atomic-scale observation of thermally driven grain-boundary migration associated with triple-junction motion →