Atomic scale defect formation and phase transformation in Si implanted β-Ga2O3

Wildfire

Skills

Posted on

June 5, 2023

← Thermal stability of HVPE-grown (0001) α-Ga2O3 on sapphire template under vacuum and atmospheric environments Characterization of micro-burnup treat irradiated U-22.5 at.% Zr and U-52.8 at.% Zr foils by transmission electron microscopy and X-ray diffraction →