FIB Based Fabrication of an Operative Pt/HfO2/TiN Device for Resistive Switching inside a Transmission Electron Microscope FIB Lamella, HRSTEM, HRTEM, Lightning, Materials Science, Micro Electronics Skills Posted on June 28, 2017 ← In-situ STEM imaging of growth and phase change of individual CuAlX precipitates in Al alloy Environmental Transmission Electron Microscopy (ETEM) Studies of Single Iron Nanoparticle Carburization in Synthesis Gas →