Using our Ocean system, scientists demonstrate the power of combining multiple electron microscopy methods, showing for the first time how the desilication mechanism of zeolite crystals proceeds in 3D on the single particle level.

Dr. Hanglong Wu and his colleagues from the Eindhoven University of Technology, ETH Zurich and University of California, Irvine provide a robust answer to this pressing question by developing a novel approach for studying complex reactions in solution. This concept, which they term a “distributed electron microscopy (EM) method” combines information from multiple EM methods, including LPEM, cryogenic EM and cryo-electron tomography. To demonstrate this powerful method, Dr. Wu and his colleagues use our dedicated LPEM solution to study the desilication mechanism of zeolite crystals. They show for the first time with an exceptional level of confidence how the reaction proceeds in 3D on the single particle level. Moreover, they show how LPEM can be combined with cryo-EM to study a complete reaction which is essential to rule out beam-induced effects in LPEM experiments. 

The desilication study

Dr. Wu and his colleagues employ a distributed electron microscopy method to study the desilication process in zeolite crystals, showing how the reaction proceeds in 3D and what controls the desilication kinetics. This distributed approach enables them to explore and understand the native mechanism at hand, exploiting the power of each imaging modality – LPEM, cryogenic EM (cryo-EM) and cryo-electron tomography (cryo-ET). The researchers use Al-zoned ZSM-5 zeolites, which have an aluminum-rich rim and an aluminum-poor core, as a model system, to study the desilication process. The reason this is an ideal model system is that ZSM-5 crystals have a complex 3D morphology and are also considerably beam-sensitive.

The two videos below respectively show the automated sample loading process assisted by a liquid handling machine called SciTEM, and how the desilication process was initiated via the manual flowing of an NaOH solution into the cell.

Movie 2: Movie showing that the liquid cell is gradually filled with 0.6 M NaOH

Using LPTEM to observe the desilication process

Using LPTEM, Dr. Wu and his colleagues monitored the desilication process of individual parent zeolite crystals in multiple areas of a single cell. In the movie below, the desilication process of three pre-etched zeolite crystals can be observed over a 3-hour period. In contrast, for the crystals without the pre-etching treatment, the researchers find that the zeolites were only partially desilicated after 30 h in the liquid cell.

Movie 3: Movie showing the desilication process of three pre-etched zeolite crystals. On the left is the raw data movie and on the right a 30-frame-averaged data movie

LPTEM vs. LPSTEM

The LPSTEM results (Figure 1) observed by the researchers were significantly different from the LPEM observations. Dr. Wu and his colleagues believe that the differences mainly originate from contrast formation mechanisms and the localized electron distribution of each imaging mode. On one hand, LPTEM enables the quick control of the localized low electron flux homogeneously across the field of view. However, the appearance of diffraction contrast from the defects can be problematic for quantitative contrast interpretations. On the other hand, LPSTEM enables the better understanding of sample contrast evolution due to being less affected by diffraction effects. Simultaneously, however, the focused high flux electron probe might bring localized structural changes caused by radiolysis of the sample itself and water.

Figure 1: Desilication process of Al-zoned ZSM-5 crystals imaged by pulsed LP-STEM. Scale bars: 200 nm.

Using cryo-EM and cryo-ET to observe the desilication process

Monitoring the desilication process using cryo-EM was the next step for Dr. Wu and his colleagues. Unlike LPEM, cryo-EM enabled the researchers to monitor the process in the absence of confinement and electron beam effects. In practice, cryo-TEM is generally performed prior to an in situ study, as it provides key information on what intermediate structures are present and, most importantly, how they evolve statistically over time. The figure below shows the cryo-EM results presented for crystals at different time points, where the stages of desilication are in agreement with the collective LPEM data and the general sample evolution observed by cryo-EM.

Figure 2: Desilication process of ZSM-5 zeolites monitored by cryo-TEM (a) and cryo-STEM (b). Scale bars: 200 nm.

Movie 4: Movie showing the cryo-electron tomography 3D reconstruction of a 12 h desilicated zeolite crystal

Novelty in findings

This study is a major step forward in understanding the role that the electron beam plays in LPEM experiments. Ultimately the collective results reveal that the desilication mechanism of zeolite crystals occurs via a two-step anisotropic etching process. This complex mechanism was only discovered due to the novel distributed approach that Dr. Wu and his colleagues employed. Particularly, the combination of LPEM and cryo-EM was essential to rule out the effects of the electron beam in the LPEM experiments.

Considering the strength of this distributed method, Dr. Wu and his colleagues anticipate that the combination of LPEM and cryo-EM will become a standard approach for understanding reaction mechanisms in aqueous solutions and could even be extended to non-aqueous solutions. Moreover this method will enable scientists to draw robust conclusions on the 3D reaction mechanisms of other important beam-sensitive material systems, such as biomaterials and proteins, whereby some grand challenges in materials science and life sciences could be potentially solved.

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Using our Ocean system, scientists present new approaches to overcome the limitations in LPEM experiments by quantitatively mapping and controlling liquid layer thickness.

Original article by Hanglong Wu, Hao Su, Rick R. M. Joosten, Arthur D. A. Keizer, Laura S. van Hazendonk, Maarten J. M. Wirix, Joseph P. Patterson, Jozua Laven, Gijsbertus de With, Heiner Friedrich

Liquid phase electron microscopy (LPEM) presents itself as a fundamental technique in the monitoring of nanoscale material processes in real-time. However, there are many challenges faced by the LPEM community with regard to quantifying and controlling liquid layer thickness to achieve laboratory-scale solution conditions and high-resolution imaging.

Using our dedicated LPEM solution, Ocean, Dr. Heiner Friedrich and his team at the Eindhoven University of Technology have paved the way for the better design of LPEM experiments and improved control of solution chemistry. Specifically, they present a simple low-dose method to quantitatively map the liquid layer thickness throughout the entire viewing area of any liquid cell with minimal beam effects even during repeated measurements. Moreover, they show how you can dynamically modulate liquid thickness by tuning the internal pressure in your liquid cell. Ultimately, this paper is a major step forward in the realization of LPEM experiment designs where bulk laboratory-scale solution conditions can be achieved yet at high resolutions. 

Mapping liquid layer thickness

Mapping the liquid layer thickness throughout the entire viewing area is crucial to avoid changes to the chemical environment but still provide the necessary information to 1) estimate which resolution can be reliably achieved, 2) model beam effects and 3) control the liquid thickness throughout the experiment.

Dr. Friedrich and his team use a simple low-dose method to map the liquid layer thickness throughout the entire viewing area. They did so by first acquiring two low-magnification, low-dose TEM images: one flat field image with no electron flux information, and another image with information on the number of electrons locally transmitting the viewing area. This information, combined with the silicon nitride (SiNₓ) membrane thickness, was then used to approximate the liquid layer thickness across the sample. The figure below shows in d) the intensity map of the viewing window area in a water-filled cell, and in e) the liquid layer thickness map calculated from the intensity map using the developed method. Shown in f) is the absolute liquid thickness map obtained from the same liquid cell in (d,e) using well-established STEM-EELS measurements.

Figure 1: a) to c) show the schematic overviews of the liquid cell. d) to f) show the resulting original intensity map, the calculated thickness map using the developed method and the absolute liquid thickness map obtained from the same liquid cell using STEM-EELS measurements, respectively.

Preparing the liquid cell

To prepare the liquid cell, the researchers employed a rather rare machine called the SciTEM (Scienion AG, a CELLINK company, Germany), which automates the liquid handling. The SciTEM is capable of patterning picoliter droplets of solutions onto the chip surface with a predefined array, and automatically loading the top chip to close the liquid cell. Ultimately, this means that accurate liquid volume control and reproducible liquid cell assembly can be achieved. The video below shows this process.

Movie 1: the automated preparation of the liquid cell

Controlling liquid thickness via internal pressure modulation

Because a pressure difference exists between the liquid and the microscope vacuum, the bending of the SiNₓ membrane windows typically occurs. This results in a spatially varying liquid layer thickness that makes it challenging to interpret LPEM results due to a locally varying achievable resolution and diffusion limitations. Therefore, to improve LPEM methodology, one needs to be able to accurately and dynamically control the liquid layer thickness, which has to be achieved by modulating the pressure inside the liquid cell.

Dr. Friedrich and his team show that with reproducible inward bulging of the window membranes, an ultra-thin liquid layer in the central window area for high-resolution imaging can indeed be realized. This is depicted very well in the figure below, showing the evolution of the meniscus in a liquid cell during evaporation. When evaporation occurs (2b), the flat gas-liquid interface gradually becomes curved, and the corresponding radius of curvature becomes smaller. At the same time, outward bulging is being reduced. Finally, as shown in 2d) and 2e), the inward bulging of the membrane is expected.

Figure 2: Evolution of the meniscus in a liquid cell during evaporation

Figure 3: Reversible transformation of a liquid cell containing water from outward to inward bulging via slow evaporation. Below are the intensity and thickness profiles of the bulging transition.

Rapid and dynamic control of liquid thickness

In addition, Dr. Friedrich and his team show that one can dynamically alter liquid thickness in a programmed fashion. They do this by independently controlling the inlet and outlet pressure on the fly via pressure pumps, and therefore the internal pressure inside the cell. Specifically, they show how pressure cycling gives rise to rapid dynamic control over liquid thickness, thus providing an additional adjustable parameter for experiment design. This dynamic control over the liquid layer thickness is depicted in the video below, where liquid thickness was continually mapped during the pressure cycling.

Movie 3: Rapid dynamic control of liquid layer thickness during external pressure cycles. The corresponding intensity and thickness maps are also shown.

Novelty in findings

This paper contributes on two important fronts. Namely, it provides promising approaches to map and control liquid layer thickness in LPEM experiments with high accuracy and reliability. Using the above approaches, novel LPEM experimental designs with liquid thickness tailored to the requirement of the imaged process become imaginable. We are proud of the role that our LPEM solutions have played in making this research possible and strive to continue enabling groundbreaking research now and in the future.

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