Real-time dynamics inside your TEM
Turn your TEM into a nano-lab and understand the structure-property relationship!
Onze In Situ Oplossingen
Wat we doen
In Situ TEM, introduce a range of stimuli to your sample
Capture the dynamic structure change in situ and understand the structure-property relationship. Expand your application space with our range of heating, biasing, gas and liquid solutions.
Our MEMS technology
Functionalized Sample Carriers
Our range of Nano-Chips (MEMS devices) are functional sample carriers that replace traditional Cu grids. Based on Micro-Electro-Mechanical Systems (MEMS), they offer the unique ability to expand your application space and experiments by controlling the environment locally on the Nano-Chip. Each Nano-Chip creates a micro-scale laboratory environment within your TEM, and due to its very low mass and minimal power consumption are extremely reliable and responsive.
Application example
Thermal processing of Metal Alloys
To assist industry in identifying how the annealing process controls the structure of Al alloy, the researchers at Hunan University investigated the precipitation of Al alloy seen in this 8 hour video at 200 °C. The precipitates become visible after 1 hour indicating nucleation is complete and further growth of the precipitates interact with the dislocations. This interaction resulted in the improvement and hardness of the material, highlighting the value of in situ heating TEM enabling researchers to investigate and understand the process-structure-property relationship in one go!
Wildfire D6 on a FEI Titan
Industry annealing profile
No thermal drift / no human interference
Prof. Dr. Jianghua Chen & Chunhui Liu College of Materials Science & Engineering Hunan University, China
Application example
Defect formation in Graphene
To understand the defect formation and evolution of graphene at elevated temperatures, the researchers at Oxford University recorded this atomic resolution movie at 700 °C. This required extreme stability for visualizing the evolution of point defects and the vacancy defect can be seen growing from the tip of the adatom cluster, which re-configures into the characteristic zigzag line defect structure. As graphene is a single layer of carbon atoms, any amorphous contamination on top of graphene will decrease the contrast for imaging individual carbon atoms, therefore, heating is needed to remove contamination.
Wildfire S3 on a JEOL ARM
Extreme specimen stability
Alex W. Robertson, et. al. University of Oxford, United Kingdom DOI: 10.1021/acs.nanolett.5b02080
Contact us
Feel free to contact us with any further questions.
Request a Demo or Quote
Request a quotation or demonstration at your lab.