FIB Lamella

One of the most crucial applications of a focused ion beam (FIB) is preparing and transferring lamellae for transmission electron microscopy (TEM) investigations. Typically, sample preparation using a FIB is a very time-consuming and risky procedure.

This technique decreases preparation time, while diminishing the risks involved during thinning and transferring of the lamella.

Nanoparticles / Powders

For nanoparticle and crushed powder samples, simply pipette the solution directly onto the microheater spiral of the Nano-Chip.