Dr. Martial Duchamp
Ernst Ruska-Center for Microscopy and Spectroscopy with Electrons (ER-C) and Peter Grünberg Institute, Forschungszentrum, Jülich, Germany
|Application||Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope|
|Authors||Martial Duchamp, Qiang Xu and Rafal E Dunin-Borkowski.|
|Journal||Microsc. Microanal. 2014, page 1 of 8|
|Publication||Full Publication Here – DOI:10.1017/S1431927614013476|
Convenient Preparation of High-Quality Specimens for Annealing Experiments in the Transmission Electron Microscope
ABSTRACT: A procedure based on focused ion beam milling and in situ lift-out is introduced for the preparation of high-quality specimens for in situ annealing experiments in the transmission electron microscope. The procedure allows an electron-transparent lamella to be cleaned directly on a heating chip using a low ion energy and back-side milling in order to minimize redeposition and damage. The approach is illustrated through the preparation of an Al–Mn–Fe complex metallic alloy specimen.