Dr. Chris B. Boothroyd
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grünberg Institute, Germany Authors | C.B. Boothroyda, M.S. Morenob, M. Duchampa, A. Kovácsa, N. Mongec, G.M. Moralesc, C.A. Barberoc, R.E. Dunin-Borkowskia Email | email@example.com
|Application||Atomic Resolution Imaging and Spectroscopy of Barium Atoms and Functional Groups on Graphene Oxide|
|Authors||C.B. Boothroyda, M.S. Morenob, M. Duchampa, A. Kovácsa, N. Mongec, G.M. Moralesc, C.A. Barberoc, R.E. Dunin-Borkowskia|
|Journal||Ultramicroscopy Journal, 2014|
|Topic||Contamination Free, 2D Materials, Soft Matter, E-Beam Sensitive Imaging|
|Techniques||HRTEM, HRSTEM, EELS, Diffraction|
|Keywords||Graphene oxide; Functional groups; Scanning transmission electron microscopy; Transmission electron microscopy; Spectrum imaging; Atomic resolution; Single atom imaging|
|Publication / D.O.I.||Full Publication Here|
Atomic Resolution Imaging and Spectroscopy of Barium Atoms and Functional Groups on Graphene Oxide
ABSTRACT: We present an atomic resolution transmission electron microscopy(TEM) and scanning TEM(STEM) study of the local structure and composition of graphene oxide modified with Ba2+. In our experiments, which are carried out at 80kV,the acquisition of contamination-free high-resolution STEM images is only possible while heating the sample above 400C using a highly stable heating holder. Ba atoms are identified spectroscopically in electron energy-loss spectrum images taken at 800C and are associated with bright contrast in high-angle annular dark-field STEM images. The spectrum images also show that Ca and O occur together and that Ba is not associated with a significant concentration of O. The electron dose used for spectrum imaging results in beam damage to the specimen, even at elevated temperature. It is also possible to identify Ba atoms in high-resolution TEM images acquired using shorter exposure times at room temperature, thereby allowing the structure of graphene oxide to be studied using complementary TEM and STEM techniques over a wide range of temperatures.
Graphene, graphene-like two dimensional and other soft-mater materials attract increasing research efforts. Characterization of these type of materials in TEM, however, suffers contamination problems and e-beam damage.
Contamination, referring to the build-up of decomposed carbon on a specimen, heavily influences the quality of electron microscopy imaging. Graphene and graphene-like two dimensional materials suffer contamination the most because of two reasons 1. these materials are ultrathin, with low image contrast, the build up contamination contrast blur the original contrast easily; 2. these materials are with large surface area, easier to absorb hydrocarbon, water to form contamination under e-beam.
DENSsolutions heating system provides the opportunity to image these samples free of contamination at elevated temperature, without sacrificing the quality/resolution of imaging. The extreme high stability of DENSsolutions heating system (sample spatial drift less than 0.5nm/min) can even allow the researchers using a long exposure time (5s-8s) to image the individual carbon atoms for improving the contrast. Furthermore, the low drift allows chemical sensitive spectrum imaging to be carried down to atomic level.