In Situ TKD Stage
High resolution microstructural characterization inside your SEM under controlled sample temperature and bias
In Situ
TKD Stage
High resolution microstructural characterization inside your SEM under controlled sample temperature and bias
DENSsolutions now introduces an in situ TKD stage (holder) for scanning electron microscopes (SEM) and dual beam microscopes (SEM-FIB). For the first time in the market, this stage allows you to perform microstructural characterization using Transmission Kikuchi Diffraction (TKD) while heating or biasing your sample.
The TKD stage will save you valuable time on the TEM, as you can now perform a quick preliminary in situ sample characterization inside the SEM that would have otherwise taken you much longer to accomplish using the TEM.
Applications
In situ characterization of the grain size and distribution, crystal orientation and texture, phase of materials like metals, ceramics, semiconductor and composites from various applications fields such as automotive, aerospace, electronics, power generation, etc.
4 reasons to get the new TKD stage
1. High resolution orientation maps
Thanks to its unique geometry, the stage allows you to perform analysis using the Transmission Kikuchi Diffraction method (TKD). This results in improved spatial resolution and simplified grain orientation mapping. Moreover, this stage enables the quantitative characterization of electron transparent crystalline nanomaterials with ultrafine grains ranging from 10 to 100 nm.
Image courtesy of University of Sydney
3. Experience uniform workflow
Both the TKD stage and our In Situ TEM solutions use the same stimuli supply components and control software. This makes it especially convenient for existing customers to add the TKD stage to their workflow.
4. High level of compatibility
The TKD stage is compatible with several Thermo Fisher Scientific (FEI), Zeiss and JEOL SEM/FIB devices and compatible with several Bruker and Oxford instruments detectors*.
*Please download our flyer for specific model types
4. High level of compatibility
The TKD stage is compatible with several Thermo Fisher Scientific (FEI), Zeiss and JEOL SEM/FIB devices and compatible with several Bruker and Oxford instruments detectors*.
*Please download our flyer for specific model types
What customers say
“Combing the capabilities of the DENSsolutions lightning chips with the versatility of TKD means that we can get statistical analytical information that would otherwise be missed such as phase fractions, average grain sizes and distributions.
The stage integrates seamlessly with our TKD workflows and can be used as a screening tool for TEM experiments or as a powerful technique in its own right.”
University of Sydney, Sydney, Australia
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